Ion Mill

P4,500/sample (P3,600 student rate)

The ion milling process is also a cross-section polishing technique that uses argon gas and ion beam and is a stress and contamination-free process in contrast with the conventional mechanical polishing and cutting techniques. This process offers a much larger scale compared with FIB sectioning.

• • Precise cross-section acquisition
  • Final polishing
  • Surface cleaning for SEM
  • Micro to nano-imaging
  • Can cross-section 1mm x 1mm specimen
  • Up to 6 Kv
  • Cross-section thickness is around 400 microns
  • 500 micron Ion beam

Applications

Micro-etching of surface
Sample Preparation for SEM and EDS analysis.