P4,500/sample (P3,600 student rate)
The ion milling process is also a cross-section polishing technique that uses argon gas and ion beam and is a stress and contamination-free process in contrast with the conventional mechanical polishing and cutting techniques. This process offers a much larger scale compared with FIB sectioning.
- Precise cross-section acquisition
- Final polishing
- Surface cleaning for SEM
- Micro to nano-imaging
- Can cross-section 1mm x 1mm specimen
- Up to 6 Kv
- Cross-section thickness is around 400 microns
- 500 micron Ion beam
Micro-etching of surface
Sample Preparation for SEM and EDS analysis.
At most 10 mm x 11 mm x 2 mm (lwh)
Any non-heat sensitive solid material that fits sample size limitation
Takes a long time to finish, slow