Surface Analysis

We perform analytical tests focusing on the outermost layer of solid materials to determine elemental, molecular, and chemical state of the surface.

Surface Analysis

We perform analytical tests focusing on the outermost layer of solid materials to determine elemental, molecular, and chemical state of the surface.

The most vital part of every material lies mainly on its layer that is exposed to different external stimuli that dramatically affect its performance and properties. This makes materials highly susceptible to contamination and surface defects leading to failure. Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface-sensitive analytical method that performs both qualitative and quantitative analysis of elemental and molecular species on the sample. TOF-SIMS has a wide range of elemental detection, surveying almost all elements present in the sample in parts per million (ppm) or atomic mass unit (amu) range.In ADMATEL, our analysts are dedicated in providing accurate, fast, and reliable results using the following techniques for TOF-SIMS Analysis.

Surface Spectrometry is the application of very low primary ion dose densities. It is a type of “quasi non-destructive surface analysis” wherein we can analyze elements and ions in the surface of our samples.

✓ Elemental and molecular information
✓ ppm sensitivity (6-10 nm)
✓ Mass resolution > 10K
✓ Suited for insulators

Surface Imaging is the rastering of a finely focused ion beam over the surface mass resolved secondary ion images (chemical maps).

✓ Lateral distribution of elements and molecules
✓ Lateral resolution down to 60 nm
✓ Parallel mass detection
suited for insulators
✓ Sample consumption is very critical for high mass molecular ions.

Depth Profiling applies the dual-beam method and utilizes two plasma sources for sputtering and another for the analysis.

Interlaced Mode
✓ Sputtering and analysis quasi-simultaneously
✓ High data and high erosion rate
✓ Ideal for conducting samples

Non-Interlaced Mode
✓ Sputtering and analysis are separated into different cycles
✓ Additional “pausing” cycle for charge compensation
✓ Ideal for insulating samples

3D Analysis combines imaging and depth profiling process producing successive ion images which can be further processed forming three-dimensional dataset

ADMATEL’s Focused Ion Beam – Field Emission Scanning Electron Microscope (FIB-FESEM) has the capability to observe and analyze a broad range of samples including insulative materials at magnification up to 1,000,000x. This type of imaging is ideal for obtaining topography, morphology, particle size and sub-micron defects using different modes of detection to fully visualize its physical characteristics.

Scanning electron micrograph of Tin (Sn) balls at 30,000x magnification

Scanning electron micrograph showing rough morphology of paint containing functionalized-Titania at 200,000x magnification

Source: Sino, Paul Albert & Herrera, Marvin & Balela, Mary Donnabelle. (2017). Creation of hydrophobic surfaces using a paint containing functionalized oxide particles. IOP Conference Series: Materials Science and Engineering. 201. 012022. 10.1088/1757-899X/201/1/012022.