Non-Destructive Analysis
We perform analytical tests focusing on the outermost layer of solid materials to determine the elemental, molecular, and chemical state of the surface.
© Ian Valiente Photography
Actual Images & Data of Analysis
Focused Ion Beam (FIB) Sectioning is used for site-specific material milling. It is capable of producing small-scale, “polished-finish” cross-sections, free of curtaining and smearing. It uses a focused beam of ions, in particular Ga+ ions, to remove material at a range of pre-defined currents.
Using ADMATEL’s Focused Ion Beam (FIB), here is an etched image of Dr. Jose Rizal on Copper substrate captured at 6,000x magnification with an approximate size of 16×21 microns.
This portrait is just three times the size of a red blood cell.
