Sample Preparation

We perform analytical tests focusing on the outermost layer of solid materials to determine the elemental, molecular, and chemical state of the surface.

© Ian Valiente Photography

Actual Images & Data of Analysis
ADMATEL Mechanical Preparation vs Ion Milling

Mechanical Polish

Ion Beam Polish

Cross-sectional micrographs of gold and nickel-plated sample show the main difference between samples subjected to mechanical preparation and ion mill cross-sectioning

When mechanical damage has the tendency to hide features desired for inspection, ion-based techniques such as Focused Ion Beam (FIB) and Ion Milling is the preferred way to prepare a sample cross-section.
Both techniques use highly energetic argon ions to bombard the sample surface and etch a cavity to the desired depth. It is ensured that no contamination occurs during the process since these techniques
are vacuum-based.

The cross-section observed after ion milling shows clearer microstructure compared to the conventional mechanical preparation

Focused Ion Beam (FIB) Sectioning is used for site-specific material milling.  It is capable of producing small-scale, “polished-finish” cross-sections, free of curtaining and smearing.  It uses a focused beam of ions, in particular Ga+ ions, to remove material at a range of pre-defined currents.
Using ADMATEL’s Focused Ion Beam (FIB), here is an etched image of Dr. Jose Rizal on Copper substrate captured at 6,000x magnification with an approximate size of 16×21 microns.
This portrait is just three times the size of a red blood cell.

Get Free Technical Consultation

ADMATEL is open to serve you Monday-Friday, 8am-5pm. 
Call us at  (02) 8837-0461 or send us an email at

Get Free Technical Consultation

We are open Monday-Friday, 8am-5pm. Call us at  (02) 8837-0461 or send us an email at