We perform analytical tests focusing on the outermost layer of solid materials to determine the elemental, molecular, and chemical state of the surface.
© Ian Valiente Photography
Mechanical Polish
Ion Beam Polish
Cross-sectional micrographs of gold and nickel-plated sample show the main difference between samples subjected to mechanical preparation and ion mill cross-sectioning
When mechanical damage has the tendency to hide features desired for inspection, ion-based techniques such as Focused Ion Beam (FIB) and Ion Milling is the preferred way to prepare a sample cross-section.
Both techniques use highly energetic argon ions to bombard the sample surface and etch a cavity to the desired depth. It is ensured that no contamination occurs during the process since these techniques
are vacuum-based.
The cross-section observed after ion milling shows clearer microstructure compared to the conventional mechanical preparation
We are open Monday-Friday, 8am-5pm. Call us at (02) 8837-0461 or send us an email at services@admatel.com
We would like to inform our clients that we are currently experiencing temporary downtime in all our telephone trunk lines since July 11, 2022. During this downtime period, you may reach us through the ITDI Trunklines (02) 8683-7750 to 69 local 2174. You may also send us an email at services@admatel.com.
We apologize for any inconvenience this may cause.