Sample Preparation |

Sample Preparation

We perform analytical tests focusing on the outermost layer of solid materials to determine the elemental, molecular, and chemical state of the surface.

Mechanical Polish

Ion Beam Polish

Cross-sectional micrographs of gold and nickel-plated sample show the main difference between samples subjected to mechanical preparation and ion mill cross-sectioning

When mechanical damage has the tendency to hide features desired for inspection, ion-based techniques such as Focused Ion Beam (FIB) and Ion Milling is the preferred way to prepare a sample cross-section.
Both techniques use highly energetic argon ions to bombard the sample surface and etch a cavity to the desired depth. It is ensured that no contamination occurs during the process since these techniques
are vacuum-based.

The cross-section observed after ion milling shows clearer microstructure compared to the conventional mechanical preparation

Focused Ion Beam (FIB) Sectioning is used for site-specific material milling. It is capable of producing small-scale, “polished-finish” cross-sections, free of curtaining and smearing. It uses a focused beam of ions, in particular Ga+ ions, to remove material at a range of pre-defined currents.

Using ADMATEL’s Focused Ion Beam (FIB), here is an etched image of Dr. Jose Rizal on Copper substrate captured at 6,000x magnification with an approximate size of 16×21 microns.

This portrait is just three times the size of a red blood cell.