{"id":308,"date":"2020-10-23T18:57:15","date_gmt":"2020-10-23T15:57:15","guid":{"rendered":"https:\/\/startertemplatecloud.com\/e02\/?post_type=product&p=308"},"modified":"2021-11-11T15:08:48","modified_gmt":"2021-11-11T15:08:48","slug":"fib-fesem","status":"publish","type":"product","link":"https:\/\/admatel.com\/base\/product\/fib-fesem\/","title":{"rendered":"Field Emission Scanning Electron Microscopy (FE-SEM)"},"content":{"rendered":"

Test Method<\/strong><\/p><\/div><\/div><\/td><\/tr>

FESEM imaging<\/strong><\/p>

EDX point analysis<\/strong><\/p>

EDX line anaysis<\/strong><\/p>

EDX mapping<\/strong><\/p>

FIB sectioning<\/strong><\/p>

Lamella preparation (STEM imaging)<\/strong><\/p>

<\/p><\/div><\/div><\/td><\/tr>

Sample Requirements<\/strong><\/p><\/div><\/div><\/td><\/tr>

Max 2in(W) x 2in(L) x 1in(T)<\/strong>
500g max weight<\/strong>
<\/p><\/div><\/div><\/td><\/tr>

Test Limitations\/ Restrictions<\/strong><\/p><\/div><\/div><\/td><\/tr>

Not intended for biological samples (living, wet or moist)<\/strong>
Not intended for hazardous samples (toxic, fumes, etc.)<\/strong><\/p>

Not intended for radioactive samples<\/strong><\/p>

Not intended for explosive samples<\/strong><\/p>

Can cater to magnetic samples but with limitations to detector usage.<\/strong>
<\/p><\/div><\/grammarly-extension><\/grammarly-extension><\/div><\/td><\/tr>

Standard Lead Time<\/strong><\/p><\/div><\/div><\/td><\/tr>

3-5 days<\/strong><\/p>

*w\/in 24 hours if urgent<\/em><\/strong>
<\/p><\/div><\/div><\/td><\/tr><\/tbody><\/table><\/div><\/div>\n\n","protected":false},"excerpt":{"rendered":"

Starts at P7,500\/sample (P6,000 student rate)
\n<\/strong><\/h6>\n

The <\/span>Field Emission Scanning Electron Microscopy (FE-SEM) imaging technique allows visualization of very small features, around several nanometers in dimension.\u00a0 It uses a focused beam of electrons which will scan the surface of the sample.\u00a0 The interaction of the electron beam with the sample produces secondary electrons which give information on the surface topography.\u00a0 In some cases, the backscattered electrons are used to determine differences in the sample composition.<\/span><\/p>\n

    \n
  • \n
      \n
    • High-resolution and high-magnification imaging<\/strong><\/li>\n
    • Elemental composition of the sample as a spectrum, line profile, elemental map<\/strong><\/li>\n
    • Site-specific analysis, deposition, and etching of materials<\/strong><\/li>\n
    • ~20nm resolution<\/strong><\/li>\n
    • 30kV system<\/strong><\/li>\n
    • Up to 1Mx magnification<\/strong><\/li>\n
    • Capable of backscattered electron imaging<\/strong><\/li>\n
    • With ETD and TLD detector systems<\/strong><\/li>\n<\/ul>\n<\/li>\n<\/ul>\n
      \n

      Applications <\/strong><\/p>\n

      Morphological characterization including measurements, layer characterization, elemental composition. Ideal for failure analysis and materials characterization.<\/p>\n","protected":false},"featured_media":1848,"template":"","meta":{"_kad_post_transparent":"default","_kad_post_title":"","_kad_post_layout":"default","_kad_post_sidebar_id":"","_kad_post_content_style":"default","_kad_post_vertical_padding":"default","_kad_post_feature":"","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false},"product_cat":[34,35],"product_tag":[],"yoast_head":"\nField Emission Scanning Electron Microscopy (FE-SEM) | ADMATEL<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/admatel.com\/base\/our-services\/surface-analysis\/fib-fesem\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Field Emission Scanning Electron Microscopy (FE-SEM) | ADMATEL\" \/>\n<meta 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