{"id":570,"date":"2020-10-17T12:26:30","date_gmt":"2020-10-17T12:26:30","guid":{"rendered":"https:\/\/www.grafas.org\/demo01\/?page_id=570"},"modified":"2022-10-10T05:46:05","modified_gmt":"2022-10-10T05:46:05","slug":"equipment","status":"publish","type":"page","link":"https:\/\/admatel.com\/base\/our-services\/equipment\/","title":{"rendered":"Our Equipment"},"content":{"rendered":"\t\t
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OUR PREMIER
EQUIPMENT<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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OUR PREMIER
EQUIPMENT<\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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ADMATEL operates a total of eight (8) accredited, state of the art equipment capable of providing twenty-four (24) ISO-accredited testing scopes for failure analysis and materials characterization. Check out our equipment to learn about our sample requirements. <\/h5>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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\n \"3D<\/a>\"3D<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Radiographic Testing<\/a><\/div>\n

3D Computed Tomography (CT) X-Ray<\/a><\/h4>
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Surface Analysis<\/a><\/div>\n

Auger Electron Spectroscopy (AES)<\/a><\/h4>
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Compositional Analysis<\/a><\/div>\n

Differential Scanning Calorimetry (DSC)<\/a><\/h4>
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Imaging Analysis<\/a><\/div>\n

Field Emission Scanning Electron Microscopy (FE-SEM)<\/a><\/h4>
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Compositional Analysis<\/a><\/div>\n

Fourier Transform Infrared Spectrometer (FTIR)<\/a><\/h4>
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Grinding\/Polishing Wheel<\/a><\/h4>
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\n \"Handheld<\/a>\"Handheld<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Radiographic Testing<\/a><\/div>\n

Handheld X-ray Fluorescent (XRF) analyzer<\/a><\/h4>
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Ion Mill<\/a><\/h4>
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Sample Preparation<\/a><\/div>\n

Laser Decapsulation<\/a><\/h4>
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Imaging Analysis<\/a><\/div>\n

Optical Microscopy using Compound Microscope<\/a><\/h4>
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Optical Microscopy using Stereo Microscope<\/a><\/h4>
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Precision Cutting Machine<\/a><\/h4>
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Compositional Analysis<\/a><\/div>\n

Thermogravimetric analysis (TGA)<\/a><\/h4>
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Surface Analysis<\/a><\/div>\n

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)<\/a><\/h4>
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\n \"3D<\/a>\"3D<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Radiographic Testing<\/a><\/div>\n

3D Computed Tomography (CT) X-Ray<\/a><\/h4>
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\n \"Auger<\/a>\"AES\"<\/a>\"Surface<\/a>\"Surface<\/a>\"Surface-Analysis\"<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Surface Analysis<\/a><\/div>\n

Auger Electron Spectroscopy (AES)<\/a><\/h4>
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\n \"Differential<\/a>\"DSC\"<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Compositional Analysis<\/a><\/div>\n

Differential Scanning Calorimetry (DSC)<\/a><\/h4>
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Imaging Analysis<\/a><\/div>\n

Field Emission Scanning Electron Microscopy (FE-SEM)<\/a><\/h4>
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Compositional Analysis<\/a><\/div>\n

Fourier Transform Infrared Spectrometer (FTIR)<\/a><\/h4>
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Sample Preparation<\/a><\/div>\n

Grinding\/Polishing Wheel<\/a><\/h4>
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\n \"Handheld<\/a>\"Handheld<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Radiographic Testing<\/a><\/div>\n

Handheld X-ray Fluorescent (XRF) analyzer<\/a><\/h4>
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\n \"Ion<\/a>\"Stereo<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Sample Preparation<\/a><\/div>\n

Ion Mill<\/a><\/h4>
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Sample Preparation<\/a><\/div>\n

Laser Decapsulation<\/a><\/h4>
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\n \"Optical<\/a>\"Optical<\/a> <\/div>\n\n \n <\/div>\n\n \n \n <\/div>\n\n
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Imaging Analysis<\/a><\/div>\n

Optical Microscopy using Compound Microscope<\/a><\/h4>
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Imaging Analysis<\/a><\/div>\n

Optical Microscopy using Stereo Microscope<\/a><\/h4>
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Sample Preparation<\/a><\/div>\n

Precision Cutting Machine<\/a><\/h4>
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Compositional Analysis<\/a><\/div>\n

Thermogravimetric analysis (TGA)<\/a><\/h4>
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Surface Analysis<\/a><\/div>\n

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)<\/a><\/h4>
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Get free\u00a0 technical consultation from team of experts! For inquiries or quotation requests, send as an
email at For inquiries or quotation requests, send as an email at services@admatel.com<\/strong>\u00a0or call us at 8837 0461<\/strong> for more information.<\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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JOIN OUR VIRTUAL TOUR!<\/h3><\/h2>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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We are proud to share this virtual experience with you as we take you inside the 1st Philippine-owned testing facility empowered to find solutions to technological challenges as part of DOST\u2019s intervention towards supporting and contributing to local industry competitiveness. <\/strong><\/span> Explore our wide range of testing services and i<\/span>nnovation initiatives to<\/span> learn more about what<\/span> ADMATEL can offer. <\/span><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

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OUR PREMIER EQUIPMENT OUR PREMIER EQUIPMENT ADMATEL operates a total of eight (8) accredited, state of the art equipment capable of providing twenty-four (24) ISO-accredited testing scopes for failure analysis and materials characterization. Check out our equipment to learn about our sample requirements. Radiographic Testing 3D Computed Tomography (CT) X-Ray Surface Analysis Auger Electron Spectroscopy…<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":1051,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_header_footer","meta":{"_kad_post_transparent":"","_kad_post_title":"hide","_kad_post_layout":"normal","_kad_post_sidebar_id":"","_kad_post_content_style":"unboxed","_kad_post_vertical_padding":"hide","_kad_post_feature":"hide","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false},"yoast_head":"\nOur Equipment | Next Level ADMATEL Solutions<\/title>\n<meta name=\"description\" content=\"ADMATEL operates a total of eight ISO-accredited, state-of-the-art equipment capable of providing thirty services in failure analysis and materials characterization. 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