{"id":4530,"date":"2021-10-26T06:37:34","date_gmt":"2021-10-26T06:37:34","guid":{"rendered":"https:\/\/admatel.com\/base\/?page_id=4530"},"modified":"2021-11-12T07:37:07","modified_gmt":"2021-11-12T07:37:07","slug":"repeatability-and-intermediate-precision-of-the-relative-intensity-scale-in-static-tof-sims","status":"publish","type":"page","link":"https:\/\/admatel.com\/base\/repeatability-and-intermediate-precision-of-the-relative-intensity-scale-in-static-tof-sims\/","title":{"rendered":"Repeatability and Intermediate Precision of the Relative-Intensity Scale in Static TOF-SIMS"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"4530\" class=\"elementor elementor-4530\">\n\t\t\t\t\t\t<div class=\"elementor-inner\">\n\t\t\t\t<div class=\"elementor-section-wrap\">\n\t\t\t\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-f71eae1 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"f71eae1\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t\t\t<div class=\"elementor-row\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-be3c28e\" data-id=\"be3c28e\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-971c17b elementor-widget elementor-widget-heading\" data-id=\"971c17b\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<h1 class=\"elementor-heading-title elementor-size-default\">Repeatability and Intermediate Precision of the Relative-Intensity Scale in Static TOF-SIMS<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-ddee29e elementor-widget elementor-widget-text-editor\" data-id=\"ddee29e\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><em><span style=\"text-decoration: underline;\">Jayvee D. Tabal<\/span>, Marianne Therese A. Bauca, Lynne Jerisa V. Alfeche, Zamantha Nadir Z. Martin, Clairezelle Maclaine I. Cruz, Araceli M. Monsada<\/em><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d5bc2f3 elementor-widget elementor-widget-text-editor\" data-id=\"d5bc2f3\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p style=\"padding-left: 40px;\">ADMATEL, Industrial Technology Development Institute (DOST-ITDI)<br \/>DOST Compound, Bicutan, Taguig City, Metro Manila, 1631<br \/>Corresponding Author: <strong>jayvee.tabal@admatel.com; jayvee.tabal@gmail.com<\/strong> <br \/>Presented at the <strong>35th Philippine Chemistry Congress<\/strong><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<section class=\"elementor-section elementor-inner-section elementor-element elementor-element-e3b783d elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"e3b783d\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t\t\t<div class=\"elementor-row\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-f1bc878\" data-id=\"f1bc878\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-5010f48 elementor-widget elementor-widget-text-editor\" data-id=\"5010f48\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><b>Abstract:<\/b><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-fbfa06b elementor-widget elementor-widget-text-editor\" data-id=\"fbfa06b\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><span style=\"font-weight: 400;\">Static Time-of-Flight Secondary-Ion Mass Spectrometry (TOF-SIMS) is a highly-sensitive surface analysis technique commonly used to identify materials or substances at surfaces and to quantify further these sought components. Quantification is usually achieved through measuring relative peak intensities and by comparing these with appropriate peaks from reference materials. Repeatability and intermediate precision are important for these measurements in order to determine if there are significant variations in the analyses. In this study, two important instrumental contributions to the uncertainty of static SIMS intensity measurements were assessed: (a) the repeatability; and (b) the intermediate precision of positive-ion relative-intensity measurements. With negative ions, the control of the surface potential for insulators is not yet sufficiently good for high repeatability. Validation was done using ISO 23830:2008(R2017) and poly(tetrafluoroethylene) (PTFE) tape as reference material. Emission current of Bi gun was maintained at 0.80\u00b10.01 \u03bcA, with pulsed target current measurements between 0.5000 pA to 1.000 pA. Parametric conditions applied were: (a) 500&#215;500 raster area (\u03bcm<\/span><span style=\"font-weight: 400;\">2<\/span><span style=\"font-weight: 400;\">); (b) random mode; (c) 128&#215;128 raster size (pixel); and (d) 5&#215;10<\/span><span style=\"font-weight: 400;\">11 <\/span><span style=\"font-weight: 400;\">dose density (ions\/cm<\/span><span style=\"font-weight: 400;\">2<\/span><span style=\"font-weight: 400;\">), in order to achieve static mode. The analysis was also assisted with an electron flood gun for charge compensation. Calculated SIMS relative-intensity repeatability were 1.3533%, 1.4584%, 1.8310%, and 0.6112%, for each of the participant, signifying that the method passed the 3% repeatability limit and is fit for purpose. Intralaboratory comparison showed that intermediate precision is also within the acceptable range both for the lighter ionic masses (A1\/A2 values within \u00b12\u03c3) and the heavier ionic masses (A3\/A2 values within \u00b12\u03c3).<\/span><\/p><p><br \/><br \/><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-17ae057 elementor-widget elementor-widget-text-editor\" data-id=\"17ae057\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><b>Keywords: <\/b><i><span style=\"font-weight: 400;\">TOF-SIMS; static SIMS; secondary-ion mass spectrometry; repeatability and intermediate precision; surface analysis; poly(tetrafluoroethylene)<\/span><\/i><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-cb86ca4\" data-id=\"cb86ca4\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-1c2a9e8 elementor-widget elementor-widget-shortcode\" data-id=\"1c2a9e8\" data-element_type=\"widget\" data-widget_type=\"shortcode.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-shortcode\"><iframe loading=\"lazy\" src=\"https:\/\/drive.google.com\/file\/d\/15ZG7ywQkWNa635oIfjcsGfcnRTobXBpy\/preview\" width=\"640\" height=\"480\" allow=\"autoplay\"><\/iframe><\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Repeatability and Intermediate Precision of the Relative-Intensity Scale in Static TOF-SIMS Jayvee D. Tabal, Marianne Therese A. Bauca, Lynne Jerisa V. Alfeche, Zamantha Nadir Z. Martin, Clairezelle Maclaine I. Cruz, Araceli M. Monsada ADMATEL, Industrial Technology Development Institute (DOST-ITDI)DOST Compound, Bicutan, Taguig City, Metro Manila, 1631Corresponding Author: jayvee.tabal@admatel.com; jayvee.tabal@gmail.com Presented at the 35th Philippine Chemistry&#8230;<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_kad_post_transparent":"","_kad_post_title":"hide","_kad_post_layout":"fullwidth","_kad_post_sidebar_id":"","_kad_post_content_style":"unboxed","_kad_post_vertical_padding":"hide","_kad_post_feature":"hide","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v20.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Repeatability and Intermediate Precision of the Relative-Intensity Scale in Static TOF-SIMS |<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, 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