{"id":4512,"date":"2021-10-26T04:44:56","date_gmt":"2021-10-26T04:44:56","guid":{"rendered":"https:\/\/admatel.com\/base\/?page_id=4512"},"modified":"2021-11-12T07:34:15","modified_gmt":"2021-11-12T07:34:15","slug":"accuracy-and-repeatability-of-linear-measurements-using-the-field-emission-scanning-electron-microscope-fe-sem-built-in-measurement-tool-for-nanomaterials-and-nano-enabled-products","status":"publish","type":"page","link":"https:\/\/admatel.com\/base\/accuracy-and-repeatability-of-linear-measurements-using-the-field-emission-scanning-electron-microscope-fe-sem-built-in-measurement-tool-for-nanomaterials-and-nano-enabled-products\/","title":{"rendered":"Accuracy and Repeatability of Linear Measurements using the Field Emission Scanning Electron Microscope (FE-SEM) Built-in Measurement Tool for Nanomaterials and Nano-enabled Products"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"4512\" class=\"elementor elementor-4512\">\n\t\t\t\t\t\t<div class=\"elementor-inner\">\n\t\t\t\t<div class=\"elementor-section-wrap\">\n\t\t\t\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-16bc689 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"16bc689\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t\t\t<div class=\"elementor-row\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-9e75c8e\" data-id=\"9e75c8e\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-ab010c4 elementor-widget elementor-widget-heading\" data-id=\"ab010c4\" data-element_type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t<h1 class=\"elementor-heading-title elementor-size-default\">Accuracy and Repeatability of Linear Measurements using the Field Emission Scanning Electron Microscope (FE-SEM) Built-in Measurement Tool for Nanomaterials and Nano-enabled Products\n<\/h1>\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-e3b717a elementor-widget elementor-widget-text-editor\" data-id=\"e3b717a\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><span style=\"font-weight: 400;\">Alfeche, Dale Mhar B., <\/span><span style=\"text-decoration: underline;\"><span style=\"font-weight: 400;\">Bauca, Marianne Therese A.<\/span><\/span><span style=\"font-weight: 400;\">, Santillan, Abegail I., Valiente, Ian V., Sito, Princess Joyce A. and Monsada, Araceli M.<\/span><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-3bc35ee elementor-widget elementor-widget-text-editor\" data-id=\"3bc35ee\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p style=\"padding-left: 40px;\">DOST-ITDI (Advanced Device and Materials Testing Laboratory-ADMATEL)<br \/>DOST Compound, Bicutan, Taguig City, Metro Manila 1631 <br \/>Corresponding Author: <strong>services@admatel.com; celi.monsada@admatel.com; ammonsada@itdi.dost.gov.ph<\/strong><br \/>Presented at the <strong>82nd PIChE National Convention <\/strong><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<section class=\"elementor-section elementor-inner-section elementor-element elementor-element-020fb9b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"020fb9b\" data-element_type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t\t\t<div class=\"elementor-row\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-36b0dc1\" data-id=\"36b0dc1\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-ba78e11 elementor-widget elementor-widget-text-editor\" data-id=\"ba78e11\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><b>Abstract:<\/b><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a4a30c5 elementor-widget elementor-widget-text-editor\" data-id=\"a4a30c5\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><span style=\"font-weight: 400;\">The FE-SEM is an analytical tool used primarily for imaging the surface of a sample.\u00a0 Some FE-SEM systems such as the one housed in ADMATEL has a built-in measurement tool that enables the user to get dimensional information on particular features of interest.\u00a0 ADMATEL\u2019s FE-SEM is capable of acquiring the following measurements: linear, diameter, rectangular length &amp; width and angle.\u00a0 This study focused on diameter measurement only.\u00a0 Accuracy and repeatability of measurements are important especially, for dimensions\/sizes of nanomaterials\/nano powders\u00a0 that are in the nano-scale.\u00a0 The range of uncertainty must be minimized to ensure that readings are always near the true value.\u00a0 This is a critical parameter on quality control for\u00a0 products and processes that have pass\/fail criteria which are dependent on certain physical dimensions.\u00a0 Measurements were obtained from standard polystyrene nanospheres with known nominal diameter.\u00a0 All sample preparation methods and trials were carried out in a class 100k cleanroom with a controlled ambient temperature of 20-25degC and RH of 50-60%.\u00a0 An average diameter value of 61.59nm was obtained from a total of 500 readings spread among 5 analysts.\u00a0 A measurement uncertainty of \u00b13nm was reported.\u00a0 Calculated mean and measurement uncertainty were close to the true value of the standard sample, thus confirming the accuracy and repeatability of measurements using the FE-SEM\u2019s built-in measurement tool.<\/span><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-115ce81 elementor-widget elementor-widget-text-editor\" data-id=\"115ce81\" data-element_type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t<div class=\"elementor-text-editor elementor-clearfix\">\n\t\t\t\t<p><b>Keywords: <i><span style=\"font-weight: 400;\">Repeatability, nanomaterial, nano-scale, polystyrene nanospheres, measurement uncertainty <\/span><\/i><\/b><\/p>\t\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-inner-column elementor-element elementor-element-63f273a\" data-id=\"63f273a\" data-element_type=\"column\">\n\t\t\t<div class=\"elementor-column-wrap elementor-element-populated\">\n\t\t\t\t\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-130cd38 elementor-widget elementor-widget-shortcode\" data-id=\"130cd38\" data-element_type=\"widget\" data-widget_type=\"shortcode.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<div class=\"elementor-shortcode\"><iframe loading=\"lazy\" src=\"https:\/\/drive.google.com\/file\/d\/1GyCZyV_0r4j4IdofGMmviSouFYH_MWkd\/preview\" width=\"640\" height=\"480\" allow=\"autoplay\"><\/iframe><\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Accuracy and Repeatability of Linear Measurements using the Field Emission Scanning Electron Microscope (FE-SEM) Built-in Measurement Tool for Nanomaterials and Nano-enabled Products Alfeche, Dale Mhar B., Bauca, Marianne Therese A., Santillan, Abegail I., Valiente, Ian V., Sito, Princess Joyce A. and Monsada, Araceli M. DOST-ITDI (Advanced Device and Materials Testing Laboratory-ADMATEL)DOST Compound, Bicutan, Taguig City,&#8230;<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_kad_post_transparent":"","_kad_post_title":"hide","_kad_post_layout":"fullwidth","_kad_post_sidebar_id":"","_kad_post_content_style":"unboxed","_kad_post_vertical_padding":"hide","_kad_post_feature":"hide","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v20.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Accuracy and Repeatability of Linear Measurements using the Field Emission Scanning Electron Microscope (FE-SEM) Built-in Measurement Tool for Nanomaterials and Nano-enabled Products |<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" 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